Description
Develop testing protocols, such as parametric tests and burn-in tests, to enable a variety of analyses of microelectromechanical (MEM) systems, products, and components before, during, and after the building of the microsystem.
Develop testing protocols, such as parametric tests and burn-in tests, to enable a variety of analyses of microelectromechanical (MEM) systems, products, and components before, during, and after the building of the microsystem.